Zernike Polynomials and Wavefronts
作者: Scott W. Teare
作者单位: New Mexico Institute of Mining and Technology
出版社: SPIE PRESS,   2017
ISBN: 9781510608320
来源数据库: SPIE-the International Society for Optical Engineering
DOI: 10.1117/3.2266670.ch10
原始语种摘要: A wavefront from a source at infinity arrives as a plane wave having no structure related to the nature of the source. However, as the wavefront is reflected from or passes through an optical system, it can become aberrated; i.e., the plane wave changes from being flat to taking on structure. The structure in the wavefront can be measured using wavefront sensors such as a Shack–Hartmann sensor “Shack–Hartmann sensor” and modeled mathematically using Zernike polynomials.
全文获取路径: SPIE  (合作)

  • wavefront 波前
  • plane 平面
  • sensor 感受器
  • reflected 反射
  • structure 构造
  • source 
  • measured 量过的
  • nature 性质
  • infinity 无穷限大
  • optical 光学的