Multidimensional SPM applied for nanoscale conductance mapping
作者: James L. BosseIlja GrishinOleg V. KolosovBryan D. Huey
作者单位: 1* Department of Materials Science and Engineering , University of Connecticut , Storrs , Connecticut 06269-3136
2 Department of Physics , Lancaster University , Lancaster LA1 4YB , United Kingdom
3 Department of Materials Science and Engineering , University of Connecticut , Storrs , Connecticut 06269-3136
刊名: Journal of Materials Research, 2013, Vol.28 (24), pp.3311-3321
来源数据库: Cambridge University Press Journal
DOI: 10.1557/jmr.2013.365
原始语种摘要: A new approach has been developed for nanoscale conductance mapping (NCM) based on multidimensional atomic force microscopy (AFM) to efficiently investigate the nanoscale electronic properties of heterogeneous surfaces. The technique uses a sequence of conductive AFM images, all acquired in a single area but each with incrementally higher applied voltages. This generates a matrix of current versus voltage ( I – V ) spectra, providing nanoscale maps of conductance and current nonlinearities with negligible spatial drift. For crystalline and amorphous phases of a GeSe chalcogenide phase change film, conductance and characteristic amorphous phase “turn-on” voltages are mapped with results providing traditional point-by-point I – V measurements, but acquired hundreds of times faster. Although...
全文获取路径: Cambridge U Press 
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影响因子:1.713 (2012)

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关键词翻译
关键词翻译
  • amorphous 非晶质的
  • SPM 太阳质子监视器
  • faster 加快
  • atomic 原子的
  • mapping 映象
  • microscopy 显微镜检查
  • single 单独的
  • crystalline 晶质的
  • current 
  • hundreds 亚麻织物经密