Quantitative measurement of contact area and electron transport across platinum nanocontacts for scanning probe microscopy and electrical nanodevices
作者: Sai Bharadwaj VishnubhotlaRimei ChenSubarna R KhanalJing LiEric A StachAshlie MartiniTevis D B Jacobs
作者单位: 1Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, PA, United States of America
2Department of Mechanical Engineering, University of California-Merced, Merced, CA, United States of America
3Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York, United States of America
4Department of Materials Science and Chemical Engineering, Stony Brook University, Stony Brook, NY, United States of America
5Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA, United States of America
刊名: Nanotechnology, 2019, Vol.30 (4)
来源数据库: Institute of Physics Journal
DOI: 10.1088/1361-6528/aaebd6
原始语种摘要: Conductive modes of atomic force microscopy are widely used to characterize the electronic properties of materials, and in such measurements, contact size is typically determined from current flow. Conversely, in nanodevice applications, the current flow is predicted from the estimated contact size. In both cases, it is very common to relate the contact size and current flow using well-established ballistic electron transport theory. Here we performed 19 electromechanical tests of platinum nanocontacts with in situ transmission electron microscopy to measure contact size and conductance. We also used molecular dynamics simulations of matched nanocontacts to investigate the nature of contact on the atomic scale. Together, these tests show that the ballistic transport equations...
全文获取路径: IOP  (合作)
影响因子:3.842 (2012)

  • microscopy 显微镜检查
  • contact 接触圈
  • electron 电子
  • transport 输运
  • probe 探针
  • vacuum 真空
  • platinum 
  • electrical 电的
  • monolayer 单分子层
  • atomic 原子的