In situ microanalysis for trace element and isotopic data by AMS
作者: S.H Sie D.A Sims T.R Niklaus F Bruhn G Suter G Cripps
刊名: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1999, Vol.158 (1-4), pp.201-208
来源数据库: CrossRef期刊
DOI: 10.1016/s0168-583x(99)00353-5
全文获取路径: CrossRef 

  • microanalysis 微量分析
  • isotopic 同位素置换
  • trace 痕迹
  • element 元素
  • AMS Access Method Services