Patterned fabric defect detection via convolutional matching pursuit dual-dictionary
作者: Junfeng JingXiaoting FanPengfei Li
作者单位: 1Xi’an Polytechnic University
刊名: Optical Engineering, 2016, Vol.55 (5), pp.053109-053109
来源数据库: SPIE-the International Society for Optical Engineering
DOI: 10.1117/1.OE.55.5.053109
关键词: defect detectionsparse encodingconvolutional matching pursuitK-singular value decompositiondual-dictionary
原始语种摘要: Automatic patterned fabric defect detection is a promising technique for textile manufacturing due to its low cost and high efficiency. The applicability of most existing algorithms, however, is limited by their intensive computation. To overcome or alleviate the problem, this paper presents a convolutional matching pursuit (CMP) dual-dictionary algorithm for patterned fabric defect detection. A preprocessing with mean sampling is performed to eliminate the influence of background texture of fabric defects. Subsequently, a set of defect-free image blocks are selected as a sample set by sliding window. Dual-dictionary and sparse coefficiencies of the defect-free sample set are obtained via CMP and the K-singular value decomposition (K-SVD) based on a Gabor filter. Then we employ the...
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  • matching 匹配
  • fabric 构造
  • convolutional 卷积
  • defect 缺陷
  • pursuit 追踪
  • dictionary 辞典
  • detection 探测
  • preprocessing 预处理
  • patterned 满地花纹
  • features 特征