Guidelines for reporting zircon Hf isotopic data by LA-MC-ICPMS and potential pitfalls in the interpretation of these data
作者: Christopher M. FisherJeffery D. VervoortJohn M. Hanchar
作者单位: 1School of the Environment, Washington State University, Pullman, WA 99163 USA
2Department of Earth Sciences, Memorial University of Newfoundland, St. John's, NL A1B 3X5, Canada
刊名: Chemical Geology, 2014, Vol.363 , pp.125-133
来源数据库: Elsevier Journal
DOI: 10.1016/j.chemgeo.2013.10.019
关键词: Hafnium isotopesLaser ablationMC-ICPMSIn situ microanalysisReference materialIsobaric interference
原始语种摘要: Invited Technical Paper(#br)High quality analytical data are essential for the development of sound scientific interpretations. To ensure the quality of the data published in Chemical Geology, a new type of contribution has been introduced - the "Invited Technical Paper". When a particular technical issue needing discussion or clarification is identified, specialists in the technique will be invited to share their expertise. As is true for all articles published in the journal, these contributions will be subject to peer review before publication.(#br)The first topic to be treated concerns in situ Hf isotopic measurements in zircon by laser ablation inductively coupled plasma mass spectrometry. This is an extremely powerful and promising technique that has been adopted by many...
全文获取路径: Elsevier  (合作)
影响因子:3.154 (2012)