Capacitances in micro-strip detectors: A conformal mapping approach
作者: Paolo Walter Cattaneo
作者单位: 1INFN Pavia, Via Bassi 6, Pavia I-27100, Italy
刊名: Solid State Electronics, 2009, Vol.54 (3), pp.252-258
来源数据库: Elsevier Journal
DOI: 10.1016/j.sse.2009.09.030
关键词: 33E0530C20Elliptic functionsConformal mappingsMicro-strip detectorsDevice capacitances
英文摘要: Abstract(#br)The knowledge of capacitance in semiconductor micro-strip detectors is important for a correct design, simulation and understanding of the detectors.(#br)Analytical approaches can efficiently complement numerical methods providing quick results in the design phase.(#br)The conformal mapping method has proved to be the most effective analytical approach providing many realistic models (Cattaneo, 1990, 1995)[1,2].(#br)In this paper improved analytical results are presented and compared with experimental data.(#br)The excellent agreement between predictions and measurements confirms the relevance of this approach to modeling realistic detectors.
全文获取路径: Elsevier  (合作)
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影响因子:1.482 (2012)

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