Initial assessment of multilayer silicon detectors for hard X-ray imaging
作者: Xuan LiPinghan ChuZhehui WangChristopher M. O’ShaughnessyChris MorrisMarcel DemarteauRobert WagnerJunqi XieLei XiaRen-Yuan ZhuLiyuan ZhangChen HuBernhard AdamsJohn KatsoudasYujia DingCarlo SegreThomas A. SmithYanhua Shih
作者单位: 1Los Alamos National Laboratory, Physics Division, Los Alamos, NM 87545, USA
2Argonne National Laboratory, High Energy Physics Division, Lemont, IL 60439, USA
3California Institute of Technology, Physics Department, Pasadena, CA, 91125, USA
4Incom, Inc., Charlton, MA 01507, USA
5Illinois Institute of Technology, Chicago, IL 60616, USA
6University of Maryland, Baltimore County, Baltimore, MD 21250, USA
刊名: Nuclear Inst. and Methods in Physics Research, A, 2019, Vol.942
来源数据库: Elsevier Journal
DOI: 10.1016/j.nima.2019.162414
关键词: Silicon detectorMultilayerHard X-ray imaging
原始语种摘要: Abstract(#br)Silicon detectors with lower material budget, ultrafast readout and radiation hardness are under developments. These unique features make pixelized silicon sensors a good option for hard X-ray imaging. To verify the performance of spatial resolution and energy sensitivity of silicon sensors to hard X-rays, a two layer setup of Pixelink PL-D725MU sensors has been tested at the Argonne National Laboratory Advanced Photon Source (APS) ID-10 sector with 29.2 keV high photon flux ( 4 . 5 × 1 0 8 to 4 . 5 × 1 0 10 photons per second) X-rays. Better than 3 μ m spatial resolution and clear energy characterization have been achieved by both layers. Commercial CMOS sensors with superior spatial resolution could be used for phase contrast imaging...
全文获取路径: Elsevier  (合作)

  • silicon 
  • imaging 图像形成
  • readout 读出
  • multilayer 多层的
  • current 
  • width 幅度
  • detector 探测器检波器
  • spatial 空间的
  • budget 预算
  • hardness 硬度