Orientation tendency of PLD carbon films as a function of substrate temperature: A NEXAFS study
作者: E. CappelliS. IacobucciC. ScillettaR. FlamminiS. OrlandoG. MatteiP. AscarelliF. BorgattiA. GigliaN. MahneS. Nannarone
作者单位: 1CNR-ISC, Sez. di Montelibretti, P.O.B.10, 00016 Monterotondo, Rome, Italy
2CNR-IMIP, Sez. di Potenza, P.O.B.27, 85050,Tito Scalo, Potenza, Italy
3BEAR beam line, TASC-INFM, Trieste, Italy
刊名: Diamond & Related Materials, 2005, Vol.14 (3), pp.959-964
来源数据库: Elsevier Journal
DOI: 10.1016/j.diamond.2005.01.014
关键词: Carbon nano-structuresPLD depositionNEXAFSRaman spectroscopy
原始语种摘要: Abstract(#br)Electronic properties of graphene nano-structures are highly anisotropic and correlated to their basal plane orientation. In this work, we tried to study and explain how deposition temperature can draw a definite plane growth direction. Carbon films have been deposited by Pulsed Laser Ablation (Nd:YAG, 2nd harmonic: λ =532 nm, hν=2.33 eV, τ =7 ns, ν =10 Hz, Φ ≈7 J/cm 2 ), from a pyrolytic graphite target on Si <100> substrates. PLD depositions were performed in vacuum, at increasing substrate temperature, ranging from room temperature (RT) to 900 °C. Near-edge X-ray absorption fine structure (NEXAFS), SEM and Raman spectroscopy have been used to characterise the films. Using linearly polarized Synchrotron radiation and HOPG (Highly Oriented Pyrolytic Graphite) as a reference...
全文获取路径: Elsevier  (合作)
影响因子:1.709 (2012)

  • temperature 温度
  • substrate 基质
  • tendency 倾向
  • films 薄膜
  • graphitic 石墨的
  • PLD Phase-Lock Demodulation
  • deposition 沉积
  • vacuum 真空
  • plane 平面
  • sized 过筛的