Atomic force microscopy investigation of filled elastomers and comparison with transmission electron microscopy — application to silica-filled silicone elastomers
作者: F ClémentA LapraL BokobzaL MonnerieP Ménez
作者单位: 1Laboratoire PCSM-UMR 7615, ESPCI, 10 rue Vauquelin, F-75231 Paris Cedex 05, France
2RHODIA Recherches, Centre de Recherches de Lyon, 85 avenue des Frères Perret, BP62, F-69192 Saint Fons Cedex, France
刊名: Polymer, 2001, Vol.42 (14), pp.6259-6270
来源数据库: Elsevier Journal
DOI: 10.1016/S0032-3861(01)00058-1
关键词: Atomic force microscopyFilled elastomersFiller dispersion
原始语种摘要: Abstract(#br)Tapping mode atomic force microscopy experiments were conducted on silica-filled silicone elastomers. Phase images provide a good contrast between the silicone matrix and silica structures, and allow the study of silica microdispersions. However, the phase contrast is sensitive to several experimental factors, which affect the magnitude of tip-sample interactions. The dependence of the phase contrast on the free amplitude of cantilever oscillation, on the setpoint ratio, on the cantilever stiffness and on the sample modulus was investigated. The setpoint ratio was shown to be the main parameter controlling the tip-sample force, and consequently the phase contrast. By comparing the results with transmission electron microscopy experiments, the tapping mode atomic force...
全文获取路径: Elsevier  (合作)
影响因子:3.379 (2012)

  • microscopy 显微镜检查
  • silica 硅土
  • filled 满的
  • Atomic 阿吐美克牌手表
  • silicone 
  • transmission 传送
  • force 
  • atomic 原子的
  • modulus 系数
  • consequently 因此