Insight into long-period pattern by depth sectioning using aberration-corrected scanning transmission electron microscope
作者: Chenzhi SongJianlin WangJianping SunYu LiuPan ChenXiaomin LiHongquan LiuBinghui GeXuedong Bai
作者单位: 1Beijing National Laboratory for Condensed Matter Physics and Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
2School of Physical Sciences, University of Chinese Academy of Sciences, Beijing 100049, China
3Institutes of Physical Science and Information Technology, Anhui University, Hefei 230601, China
4Key Laboratory of Structure and Functional Regulation of Hybrid Materials (Anhui University), Ministry of Education, Hefei 230601, China
5College of Materials Science and Engineering, Shandong University of Science and Technology, Qingdao 266590, China
6Songshan Lake Materials Laboratory, Dongguan, Guangdong 523808, China
刊名: Ultramicroscopy, 2020, Vol.209
来源数据库: Elsevier Journal
DOI: 10.1016/j.ultramic.2019.112885
关键词: Long-period patternDepth sectioningScanning transmission electron microscopyStructural characterizationMoiré patternCu 2-x Se
原始语种摘要: Abstract(#br)Long-period patterns (LPPs) are widely observed by transmission electron microscopy (TEM) in the study of nanoscale materials. Identifying the origin of LPPs is of significant importance when interpreting TEM images, and for an in-depth understanding of material characteristics. However, the two most common LPP categories, modulated structure and moiré patterns, are not easily differentiated by conventional TEM (CTEM). In this work, an LPP was observed in Cu 2-x Se nanoplates by CTEM. And then the depth sectioning with an aberration-corrected scanning transmission electron microscope (AC STEM) has been performed to determine the LPP type. Two misorientated layers were recognized from the depth-series of atomic resolution images of an LPP region, confirming the LPP is a moiré...
全文获取路径: Elsevier  (合作)
影响因子:2.47 (2012)

  • sectioning 分节
  • pattern 模型
  • scanning 扫描
  • electron 电子
  • transmission 传送
  • depth 
  • period 
  • microscope 显微镜
  • reconstruction 复原
  • corrected 校正的