Measuring magnetic profiles at manganite surfaces with monolayer resolution
作者: A. VernaBruce A. DavidsonY. SzetoA.Yu. PetrovA. MironeA. GigliaN. MahneS. Nannarone
作者单位: 1CNR-INFM TASC National Laboratory, Area Science Park (Basovizza), 34012 Trieste, Italy
2Department of Physics, Delft University of Technology, 2628 CJ Delft, The Netherlands
3European Synchrotron Radiation Facility, 6 rue Jules Horowitz, Boîte Postale 220, 38043 Grenoble, France
4Dipartimento di Ingegneria dei Materiali e dell’Ambiente, Università di Modena e Reggio Emilia, Via Vignolese 905, 41100 Modena, Italy
刊名: Journal of Magnetism and Magnetic Materials, 2009, Vol.322 (9), pp.1212-1216
来源数据库: Elsevier Journal
DOI: 10.1016/j.jmmm.2009.05.022
关键词: Resonant magnetic scatteringXRMSSpintronicsManganiteThin filmDead layer
原始语种摘要: Abstract(#br)The performance of manganite-based magnetic tunnel junctions (MTJs) has suffered from reduced magnetization present at the junction interfaces that is ultimately responsible for the spin polarization of injected currents; this behavior has been attributed to a magnetic “dead layer” that typically extends a few unit cells into the manganite. X-ray magnetic scattering in resonant conditions (XRMS) is one of the most innovative and effective techniques to extract surface or interfacial magnetization profiles with subnanometer resolution, and has only recently been applied to oxide heterostructures. Here we present our approach to characterizing the surface and interfacial magnetization of such heterostructures using the XRMS technique, conducted at the BEAR beamline (Elettra...
全文获取路径: Elsevier  (合作)
影响因子:1.826 (2012)

  • manganite 水锰矿
  • monolayer 单分子层
  • magnetic 磁的
  • magnetization 磁化
  • scattering 散射
  • obtain 获得
  • attributed 属性
  • resulting 引起的
  • specular 镜的
  • reflectivity 反射比