Substrate heterostructure effects on interface composition, microstructure development and functional properties of PZT thin films
作者: Salah HaboutiAbdelilah LahmarMatthias DietzeClaus-Henning SolterbeckVladimir ZaporojtchenkoMohammed Es-Souni
作者单位: 1Institute for Materials & Surface Technology, University of Applied Sciences, Grenzstr. 3, 24149 Kiel, Germany
2Faculty of Engineering, Christian-Albrechts-University, Kiel, Germany
刊名: Acta Materialia, 2009, Vol.57 (7), pp.2328-2338
来源数据库: Elsevier Journal
DOI: 10.1016/j.actamat.2009.02.005
关键词: PZTXPSDepth profilingInterface
英文摘要: Abstract(#br)Platinum- and (La 0.8 ,Sr 0.2 )MnO 3 (LSMO)-terminated silicon substrates were used for the liquid-phase deposition of Pb(Zr 0.52 ,Ti 0.48 )O 3 (PZT) thin films. Different layer thicknesses ranging from 100 to 600nm were processed by sequential coating. Characterization of the films involved X-ray diffraction, atomic force microscopy and X-ray photoelectron spectroscopy (XPS) combined with depth profiling to probe the interface composition. The films deposited on Pt exhibit an intermetallic layer, Pt x Pb, after annealing at 500°C in air. This film has been used to establish the XPS signature of the intermetallic phase which consists of a negative shift of the peak position of Pt(4f) due the electron transfer from Pb to Pt. In all cases...
全文获取路径: Elsevier  (合作)
影响因子:3.941 (2012)

  • PZT Photographic Zenith Telescope
  • microstructure 微结构
  • properties 道具
  • Substrate 感光胶层、基片
  • functional 功能的
  • films 薄膜
  • development 开发
  • interface 界面
  • effects 海员自身物品
  • profiling 仿形切削