Application of a silicon drift detector to measuring internal conversion electrons and analysis of their spectra
作者: Haifei ZhangRui WuWenjie WanTiancheng FengWeiguo LeiYindong WangBin LongJingpeng YinJinfeng ZhanJianbin Zhou
作者单位: 1Northwest Institute of Nuclear Technology, Xi’an 710024, People’s Republic of China
2College of nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu 610059, People’s Republic of China
刊名: Nuclear Inst. and Methods in Physics Research, A, 2020, Vol.950
来源数据库: Elsevier Journal
DOI: 10.1016/j.nima.2019.162941
关键词: Silicon drift detector (SDD)Internal conversion electrons (ICEs)Pearson IV distributionLevenberg–Marquardt algorithm137 Cs 131 m Xe
原始语种摘要: Abstract(#br)Small-volume, low-capacitance semiconductor X-ray silicon drift detectors (SDDs) have an excellent ability to resolve closely spaced X-ray lines. But the application to electrons is less known. We designed a detector system and performed spectrometry using SDDs for radionuclides emitting mono-energetic internal conversion electrons (ICEs) with energies from 129 keV to 656 keV. The system is compact, maintains simple readout electronics, and provides high-resolution measurements of ICEs without cooling to liquid nitrogen temperatures and without bulky lead shielding. Preliminary measurements using 137 Cs and 131 m Xe are conducted to verify that SDDs are suitable as ICE spectrometers. Unlike that of X/ γ spectrometry, the shape of the ICE spectra is a non-Gaussian distribution...
全文获取路径: Elsevier  (合作)

  • drift 水平巷道
  • silicon 
  • detector 探测器检波器
  • spectra 光谱
  • measuring 测量
  • semiconductor 半导体
  • Application 应用
  • distribution 分布
  • readout 读出
  • without 在之外