Application of Digital Analog of Increase of Resolving Power of the X-Ray Diffraction Equipment for Characterization of an Imperfect State of Crystalline Materials
作者: N. M. Rozhenko, O. M. Grigoriev, V. V. Kartuzov
作者单位: 1I. M. Frantsevich Institute for Problems in Materials Science, NAS of Ukraine, 3 Academician Krzhyzhanovsky Str., UA-03142 Kyiv, Ukraine
刊名: Metallofiz. Noveishie Tekhnol., 2018, Vol.40 (09), pp.1149-1164
来源数据库: G.V. Kurdyumov Institute for Metal Physics, National Academy of Science of the Ukraine
DOI: 10.15407/mfint.40.09.1149
关键词: ConvolutionPhysical profileCrystal defectsSeparation of diffraction effects.
原始语种摘要: The technique of analysis of the x-ray patterns’ shape using Tikhonov’s regularization method to reconstruct a physical profile (i.e., radial distribution of reflection intensity, the broadening of which is caused by crystal defects only) is described. A procedure for the separation of x-ray diffraction effects on the crystal lattice with microstrains and on coherent scattering regions is proposed. It is based on the recovery of total physical profile shape, does not require a priori assumptions about a law of microstrain distribution, and allows taking into account for a broadening-function type within the areas of coherent scattering.
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  • diffraction 衍射
  • microstrain 微应变
  • broadening 扩展
  • crystal 晶体
  • Application 应用
  • regularization 正则化
  • scattering 散射
  • profile 纵断图
  • distribution 分布
  • shape 形状