Beam interactions with materials and atoms
作者: MaryamKianiMarjanAshouriFeridounSamavat
刊名: Physics Essays, 2018, Vol.31 (1), pp.14-21
来源数据库: Physics Essays
DOI: 10.4006/0836-1398-31.1.14
原始语种摘要: During the study of materials, some properties are considered to be dependent on the surface structure. Various techniques such as low energy ion scattering (LEIS), secondary ion mass spectroscopy (SIMS), and auger electron spectroscopy (AES) are used to study the surfaces of materials. Some of these techniques are more sensitive to the topmost layers of the surfaces than others, and we will discuss the details later. LEIS is also called Ion Scattering Spectroscopy and is a tool used for the study of the atomic composition, concentration, and structure of a surface, using low energy ions with energy ranging from 100 eV to 10 keV scattered off the surface. This technique is known to be more sensitive to the first layer, the nondestructive in-depth analysis of the near surface (0–10 nm)....
全文获取路径: 物理学论文  (合作)

  • materials 工业三废
  • surface 
  • atomic 原子的
  • vacuum 真空
  • layers 
  • energy 能量
  • properties 道具
  • secondary 二次的
  • topmost 最顶层
  • structure 构造