Klebsiella pneumoniae antibiotic resistance identified by atomic force microscopy
作者: Vincenzo IerardiPaolo DomenichiniSilvia RealiGian Marco ChiapparaGianluigi DevotoUgo Valbusa
作者单位: 1University of Genoa
2BiuBi srl
3Ospedale di Lavagna
4ASL 4
刊名: Journal of Biosciences, 2017, Vol.42 (4), pp.623-636
来源数据库: Springer Nature Journal
DOI: 10.1007/s12038-017-9713-6
关键词: AFMAntibiotic resistanceBacteria imagesKlebsiella pneumoniae
原始语种摘要: In the last decade the detection of the resistance of bacteria to antibiotics treatment, developed by different kind of bacteria, is becoming a huge problem. We hereby present a different approach to the current problem of detection of bacteria resistance to antibiotics. Our aims were to use the atomic force microscopy (AFM) to investigate bacteria morphological changes in response to antibiotics treatment and explore the possibility of reducing the time required to obtain information on their resistance. In particular, we studied Klebsiella pneumoniae bacteria provided by the Lavagna Hospital ASL4 Liguria (Italy), where there are cases linked with antibiotics resistance of the Klebsiella pneumoniae . By comparing AFM images of bacteria strains treated with different antibiotics is...
全文获取路径: Springer Nature  (合作)
影响因子:1.759 (2012)

  • antibiotic 抗生素
  • resistance 抵抗
  • resistant 耐久的
  • force 
  • bacteria 细菌
  • atomic 原子的
  • microscopy 显微镜检查
  • AFM Amplitude-Frequency Modulation
  • present 出席的
  • treatment 处理