Aircraft skin defect localization using imaging polarimetry
作者: David A. LuoEnrique Tomas BarrazaMichael W. Kudenov
作者单位: 1North Carolina State University
刊名: Optical Engineering, 2018, Vol.57 (8), pp.084101-084101
来源数据库: SPIE-the International Society for Optical Engineering
DOI: 10.1117/1.OE.57.8.084101
关键词: Mueller matrixImaging polarimetryOptical metrology
原始语种摘要: Aircraft coatings are critical for protecting the substrate material from corrosion, and in some cases, serve to reduce the aircraft’s RADAR cross section. A coating system is generally formed from three layers: a topcoat, primer, and substrate. Exposed substrate or primer, from defects in the topcoat, poses an operational hazard to the aircraft and can shorten a component’s lifetime. Conventional computer vision techniques require intensive image processing algorithms to detect such defects across a wide range of observation angles, variations in incident illumination, and nondefect markings. We introduce a polarimetric imaging technique that can classify topcoat defects that penetrate to the primer or substrate versus superficial surface markings. Results demonstrate that circular and...
全文获取路径: SPIE 

  • imaging 图像形成
  • polarimetry 旋光分析
  • demonstrate 说明
  • illumination 光照强度
  • topcoat 轻薄大衣
  • defect 缺陷
  • metrology 度量衡学
  • technique 技术
  • substrate 基质
  • pixel 像素